Henniker Scientific

Measurement and Control

A wide range of measurement and control devices for thin film deposition applications.

Featuring the latest in electronics technology, our range of measurement and control devices for thin film deposition applications includes thickness/rate monitors, bakeout control, pressure measurement and also sample and source heater controllers.

  • Ion Gauge Controllers
  • DC & Pulsed DC Magnetron Power Supplies
  • Thin Film Deposition Rate Controller
  • UHV Sample Heater Power Supply
  • Vacuum Bakeou Controller
  • Vacuum System Controllers
  • Thin Film Thickness Monitors


Deposition Components

Many of the individual devices used in our deposition systems are available as individual components for addition to existing systems or for upgrading older or no longer supported technologies. 


  • Magnetron Sputtering
  • Thermal Evaporation
  • E-Beam Evaporation

Measurement and Control

  • Magnetron Power Supplies
  • Rate and Thickness Monitors 
  • Multi-Channel Rate Controllers 
  • Quartz Balances


Deposition Manipulators

A dedicated range of UHV sample manipulators for Thin Film Deposition.

  • Precision multi-axis
  • Manual or motorised control
  • MBE, Sputtering and targeted PLD


Deposition Systems

Multi-Technique Deposition

Multi-technique UHV deposition systems, uniquely designed with simple single chamber techniques or combinations of techniques in linear or cluster formation and with scope for future explansion.



PLD Systems

Advanced UHV Systems for Pulsed Laser Deposition



MBE Systems

 Advanced UHV Systems for Molecular Beam Epitaxy



Sputter Deposition Systems

A wide range of standard and customisable HV and UHV magnetron sputtering systems with configurations options for both magnetic and non-magnetic materials.



Tribology Systems

A range of systems for tribology serving researchers in the science and engineering of interacting surfaces in relative motion. Applications for the study and application of the principals of friction, lubrication and wear. Modules on the systems enable the study of tribological properties between two surfaces in UHV or ambient pressure conditions.



Key dates:

Abstract submission deadline: [extended]

8 February 2021

Expressions of interest:

19 March 2021

Registration deadline:

8 April 2021

Poster submission deadline:

9 April 2021

Organised by the IOP Magnetism Group

Digital sponsors: